| Autor: |
K. M. Moiseev, D. D. Vasilev, S. Yu. Hydyrova |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
XLIII ACADEMIC SPACE CONFERENCE: dedicated to the memory of academician S.P. Korolev and other outstanding Russian scientists – Pioneers of space exploration. |
| ISSN: |
0094-243X |
| DOI: |
10.1063/1.5133246 |
| Popis: |
Superconducting single-photon detectors (SNSPD) are receivers in optical systems for space communications and exhibit high quantum efficiency and count rate. The receiver in the optical system of atmospheric communication should provide highly efficient detection of radiation with a wavelength of 1.55 µm. The cut-off wavelength of SNSPD is the maximum wavelength of radiation at which high detection efficiency is maintained and depends on the geometrical parameters of the sensitive element of the detector and the thickness and structure of the thin film of superconducting material parameters. In this work, we simulate the cut-off wavelength depending on the thickness of the superconducting film WxSi1-x and the stoichiometric composition with a nanowire width of 100 nm and a ratio of the bias current to the critical 0.7. It is shown that the largest value of the cut-off wavelength λc = 3.06 µm corresponds to a film thickness of 5 nm and a Si content of 25%. With a film thickness of 7 nm, detection with the required wavelength of 1.55 µm is provided over the entire investigated range of the stoichiometric composition of the film: when the Si content is from 15 to 25%.Superconducting single-photon detectors (SNSPD) are receivers in optical systems for space communications and exhibit high quantum efficiency and count rate. The receiver in the optical system of atmospheric communication should provide highly efficient detection of radiation with a wavelength of 1.55 µm. The cut-off wavelength of SNSPD is the maximum wavelength of radiation at which high detection efficiency is maintained and depends on the geometrical parameters of the sensitive element of the detector and the thickness and structure of the thin film of superconducting material parameters. In this work, we simulate the cut-off wavelength depending on the thickness of the superconducting film WxSi1-x and the stoichiometric composition with a nanowire width of 100 nm and a ratio of the bias current to the critical 0.7. It is shown that the largest value of the cut-off wavelength λc = 3.06 µm corresponds to a film thickness of 5 nm and a Si content of 25%. With a film thickness of 7 nm, detection with the ... |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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