| Autor: |
Ed Wolak, James Harrison, Terry Towe, Touyen Nguyen, Xu Jin, Hanxuan Li, Daming Liu, Jeff Mott, Frank Reinhardt, Kiran Kuppuswamy, Trevor Crum, Robert L. Miller, Irving Chyr, Oscar Romero, Denny Brown, Tom Truchan |
| Rok vydání: |
2008 |
| Předmět: |
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| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.763945 |
| Popis: |
Leveraging improvements to device structures and cooling technologies, ultra-high-power bars have been integrated into multi-bar stacks to obtain CW power densities in excess of 2.8 kW/cm2 near 960 nm with spectral widths of 37 W CW have been obtained from 5-emitter devices on standard CuW CT heatsinks with AuSn solder. Near 808 nm, a PCE of 65% with a slope efficiency of 1.29 W/A has been demonstrated with a 20%-fill-factor, 2-mm-cavity-length bar. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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