Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant
Autor: | H. Uehara, T. Okamoto, Y. Sekii, S. Iwata, T. Takada |
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Rok vydání: | 2021 |
Zdroj: | 2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP). |
Databáze: | OpenAIRE |
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