Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant

Autor:	H. Uehara, T. Okamoto, Y. Sekii, S. Iwata, T. Takada
Rok vydání:	2021
Zdroj:	2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::364d13938e5cd2faeae49f2e36467f3a https://doi.org/10.1109/ceidp50766.2021.9705439 Zobrazit plný text záznamu