Polymer Interphases in Adhesively Bonded Joints – Origin, Properties and Methods for Characterization
| Autor: | Paul Ludwig Geiss, Melanie Schumann |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
chemistry.chemical_classification
010407 polymers Materials science Mechanical Engineering Stress–strain analysis 02 engineering and technology Polymer 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences 0104 chemical sciences Characterization (materials science) chemistry Mechanics of Materials General Materials Science Interphase Adhesive Composite material 0210 nano-technology |
| Zdroj: | Materials Science Forum. 941:2249-2254 |
| ISSN: | 1662-9752 |
| Popis: | Chemically curing adhesives are formulations requiring reactions to convert from liquid to solid. Once cured, these adhesives carry the potential to create strong load bearing joints, resisting even severe detrimental service conditions. In adhesively bonded joints with chemically curing adhesives the term "interphase" relates to the adhesive volume adjacent to the surface of the adherent (interface), which generally will exhibit properties different from those of the adhesive bulk polymer. The properties of these interphases play an important role concerning the performance and durability of structural adhesive joints. Therefore localized strain analysis in the cross-section of shear-loaded adhesive joints was performed by combining a high-precision mechanical testing device with digital microscopy and by developing a method for preparing, marking, and digitally tracking the local deformations in micro shear specimen. Non-uniform shear profiles developing in the cross-section of the adhesive joints after exceeding the yield point serve as a sensitive indication for mechanical surface-affected interphase properties and it could be observed, that deranged crosslinking promotes strain softening of the polymer in the interphase. Infrared analysis of the cross-sectional interphase region in adhesively bonded joints was performed with a Bruker Tensor II Fourier Transform Infrared (FTIR) spectrometer equipped with a Hyperion 3000 microscope with a 20x ATR germanium crystal objective and a MCT-Focal-Plane-Array-Detector (FPA), allowing to conduct high resolution chemical imaging and localized chemical analysis. |
| Databáze: | OpenAIRE |
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