Atomic spectrometry update: review of advances in X-ray fluorescence spectrometry and its special applications
| Autor: | Christine Vanhoof, Jeffrey R. Bacon, Ursula E. A. Fittschen, Laszlo Vincze |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Journal of Analytical Atomic Spectrometry. 37:1761-1775 |
| ISSN: | 1364-5544 0267-9477 |
| DOI: | 10.1039/d2ja90035a |
| Popis: | This review covers developments in and applications of XRF techniques such as EDXRF, WDXRF, TXRF, XRF microscopy using technologies such as synchrotron sources, X-ray optics, X-ray tubes and detectors in laboratory, mobile and hand-held systems. |
| Databáze: | OpenAIRE |
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