Characterisation of thin film superconducting multilayers and their interfaces using secondary ion mass spectrometry
| Autor: | Judith L. MacManus-Driscoll, N. J. Montgomery, B. Moeckly, K. Char, David S. McPhail |
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| Rok vydání: | 1997 |
| Předmět: |
Static secondary-ion mass spectrometry
Leading edge Materials science Ion beam Ion beam mixing Mechanical Engineering Metals and Alloys Analytical chemistry chemistry.chemical_element Molecular physics Secondary ion mass spectrometry Ion beam deposition Xenon chemistry Mechanics of Materials Condensed Matter::Superconductivity Materials Chemistry Thin film |
| Zdroj: | Journal of Alloys and Compounds. 251:355-359 |
| ISSN: | 0925-8388 |
| DOI: | 10.1016/s0925-8388(96)02810-1 |
| Popis: | A superconducting multilayer structure (YBCO/3% Co-doped YBCO/YBCO/LaAlO3) has been studied using secondary ion mass spectrometry (SIMS). Under xenon ion beam bombardment at a range of angles of incidence it has been found that the Co leading edge interface width is invariant at 68 nm/decade. This broadening cannot be solely explained in terms of beam induced mixing or the topography present at that depth, suggesting that some diffusion or segregation has taken place during the growth of the sample. The trailing edge Co interface width, however, gets progressively worse as the angle of incidence of the ion beam is increased. This is believed to be a SIMS artefact and is attributed to the development of topography in the crater base as the analysis proceeds. |
| Databáze: | OpenAIRE |
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