Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations

Autor:	N Sarkar, P R Bandaru, R C Dynes
Rok vydání:	2023
Předmět:	Mechanics of Materials Mechanical Engineering General Materials Science Bioengineering General Chemistry Electrical and Electronic Engineering
Zdroj:	Nanotechnology. 34:15LT01
ISSN:	1361-6528 0957-4484
DOI:	10.1088/1361-6528/acb442
Popis:	A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling microscope tip-induced deformation, is demonstrated. Surface elastic deformation characteristics of soft 2D monatomic sheets of graphene and graphite in contrast to NbSe2 indicates related association with the underlying local bonding configurations. Surface deformation of 2D graphitic moiré patterns reveal the inter-layer van der Waals strength varying across its domains. These results help in the understanding of the comparable interlayer bonding strength of 1D grain boundary as well as the grains. Anomalous phenomena related to probing 2D materials at small gap distances as a function of strain is discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3560bec00d78a25e8a84f3f87a4dc48e https://doi.org/10.1088/1361-6528/acb442 Zobrazit plný text záznamu