A Two-Level Approach to Automated Conformance Testing of VHDL Designs

Autor: Ronald L. C. Koymans, Olaf Sies, Judi Romijn, Jan Springintveld, Jean R. Moonen, Loe G.M. Feijs
Rok vydání: 1997
Předmět:
Zdroj: Testing of Communicating Systems ISBN: 9781475767018
DOI: 10.1007/978-0-387-35198-8_28
Popis: For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue. To improve performance, parts of this software are implemented in hardware, often designed in the Hardware Description Language VHDL. Conformance testing is a time consuming and error-prone process. Thus automating (parts of) this process is essential.
Databáze: OpenAIRE