A Two-Level Approach to Automated Conformance Testing of VHDL Designs
Autor: | Ronald L. C. Koymans, Olaf Sies, Judi Romijn, Jan Springintveld, Jean R. Moonen, Loe G.M. Feijs |
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Rok vydání: | 1997 |
Předmět: | |
Zdroj: | Testing of Communicating Systems ISBN: 9781475767018 |
DOI: | 10.1007/978-0-387-35198-8_28 |
Popis: | For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue. To improve performance, parts of this software are implemented in hardware, often designed in the Hardware Description Language VHDL. Conformance testing is a time consuming and error-prone process. Thus automating (parts of) this process is essential. |
Databáze: | OpenAIRE |
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