| Autor: |
O. Lacroix, Thierry Sauvage, Gilbert Blondiaux, L. Guinard |
| Rok vydání: |
1997 |
| Předmět: |
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| Zdroj: |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 122:262-268 |
| ISSN: |
0168-583X |
| DOI: |
10.1016/s0168-583x(96)00651-9 |
| Popis: |
A new calibration procedure is proposed for the application of recoil implantation of radioactive heavy ions (energies between a few hundred keV and a few MeV) into the near surface of materials as part of a research programme on submicrometric wear or corrosion phenomena. The depth profile of implanted radioelements is performed by using ultra thin deposited films obtained by cathode sputtering under argon plasma. Two curves for 56Co ion in nickel have been determined for implantation depths of 110 and 200 nm, respectively, and stress the feasibility and reproductibility of this method for such activated depths. The achieved surface loss detection sensitivities are about 1 and 2 nm respectively. The on line detection mode is performed directly on the sample of interest. A general description of the method is presented. A study of the reaction kinematics followed by a general treatment on the irradiation parameters to be adopted are also developed with the intention of using the ultra thin layer activation method (UTLA) to further applications in research and industry. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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