Maximizing Efficiency of Inspection tools using a novel high capacity unsupervised machine learning technique
Autor: | Rehab Kotb Ali, Sylvain Olivier Moulis, Jorge Entradas, Nacer Zine El Abidine, Le Hong |
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Rok vydání: | 2023 |
Zdroj: | 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC). |
DOI: | 10.1109/asmc57536.2023.10121075 |
Databáze: | OpenAIRE |
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