Maximizing Efficiency of Inspection tools using a novel high capacity unsupervised machine learning technique

Autor: Rehab Kotb Ali, Sylvain Olivier Moulis, Jorge Entradas, Nacer Zine El Abidine, Le Hong
Rok vydání: 2023
Zdroj: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
DOI: 10.1109/asmc57536.2023.10121075
Databáze: OpenAIRE