Design considerations and performance analysis of dual photodetector system for reliable laser wavelength and power monitoring
Autor: | Miloš B. Živanov, Ana Joža, Lazo M. Manojlović, Nikola Lakovic, Vladimir Milosavljevic, Jovan S. Bajić, Branislav D. Batinic |
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Rok vydání: | 2017 |
Předmět: |
Materials science
Photodetector Optical power 02 engineering and technology 01 natural sciences Signal law.invention 010309 optics 020210 optoelectronics & photonics Optics law 0103 physical sciences 0202 electrical engineering electronic engineering information engineering Electrical and Electronic Engineering Instrumentation business.industry Metals and Alloys Condensed Matter Physics Laser Surfaces Coatings and Films Electronic Optical and Magnetic Materials Photodiode Wavelength Spectral sensitivity business Tunable laser |
Zdroj: | Sensors and Actuators A: Physical. 261:14-23 |
ISSN: | 0924-4247 |
DOI: | 10.1016/j.sna.2017.04.042 |
Popis: | In this paper, a simple and low-cost sensor system based on dual photodetector for reliable laser wavelength and power monitoring, is presented. Different spectral sensitivities of Ge and InGaAs photodiodes were used to obtain ratiometric measurement of wavelength. As a signal splitter, the 2 × 2 fiber-optic coupler is used in order to increase further the spectral sensitivity of the system. This system is investigated with tunable laser source in the 1525–1630 nm range and has showed to successfully operate in the L-range of wavelengths with high linearity of R 2 = 0.99942. Measurement error around ±0.2 nm and repeatability of ±0.16 nm are achieved. By measuring system stability, the system resolution of 0.017 nm is estimated. Temperature dependence of the system is investigated and measured results proved to be consistent with theory of semiconductor behavior in the function of temperature. The sensor system dependence on changing power of tunable laser source is also investigated. In the range of 4–26 mW of the source optical power, the proposed sensor system shows wavelength stability of ±0.1 nm. |
Databáze: | OpenAIRE |
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