Smile Effect Measurement of Laser Diode Line Arrays Based on External Cavity

Autor:	邱运涛 Qiu Yun-tao, 刘友强 Liu You-qiang, 曹银花 Cao Yin-hua, 王智勇 Wang Zhiyong, 秦文斌 Qin Wen-bin, 李 景 Li Jing, 姚 磊 Yao Lei, 许商瑞 Xu Shang-rui, 曾小迪 Zeng Xiao-di
Rok vydání:	2017
Předmět:	Radiation Materials science Optics Laser diode law business.industry External cavity Line (text file) Condensed Matter Physics business Electronic Optical and Magnetic Materials law.invention
Zdroj:	Chinese Journal of Luminescence. 38:1302-1306
ISSN:	1000-7032
DOI:	10.3788/fgxb20173810.1302
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::341f7cec330636f87275b1ef9a3ed299 https://doi.org/10.3788/fgxb20173810.1302 Zobrazit plný text záznamu