Measurements with compound refractive lenses at the 'BAMline'

Autor:	Uwe Reinholz, Heinrich Riesemeier, Erik Strub, Martin Radtke, E. Reznikova
Rok vydání:	2008
Předmět:	Nuclear and High Energy Physics Extended X-ray absorption fine structure business.industry Chemistry X-ray optics Synchrotron XANES law.invention Micrometre Optics law Wafer business Absorption (electromagnetic radiation) Instrumentation Beam (structure)
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 266:2165-2168
ISSN:	0168-583X
Popis:	A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut fur Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that beam diameters below 1 lm can be obtained. The beam size accepted by the lenses is (140 140) lm 2 , thus the intensity gain in the micrometer spot, including absorption, is about 15,000. It is possible to switch between different beam energies within a few minutes. First results of scans and the application of the lenses for MicroXANES (X-ray absorption near-edge structure) measurements are presented in this paper. Also, the possibility of MicroEXAFS (extended X-ray absorption fine structure) measurements is discussed. 2008 Elsevier B.V. All rights reserved.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::33f5fc97261734bbc3175bce83c3ade8 https://doi.org/10.1016/j.nimb.2008.02.057 Zobrazit plný text záznamu Full Text from ScienceDirect