Simulation Methodology of Radiated Emission for IC Stripline Measurements
Autor: | Rick Janssen, Philip Axer, Erick Rodriguez, Wilmar Heuvelman, Gunnar Schulz-Mewes, Sergei Kapora, Stefan Kwaaitaal, Jeroen Kuenen |
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Rok vydání: | 2018 |
Předmět: |
Ethernet
business.product_category Computer science 020208 electrical & electronic engineering Electromagnetic compatibility 020206 networking & telecommunications Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Integrated circuit Low frequency law.invention CAN bus Local Interconnect Network law Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering Electronic engineering Network switch business Stripline |
Zdroj: | 2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE). |
DOI: | 10.1109/emceurope.2018.8485082 |
Popis: | A simulation methodology is proposed to simulate the radiated emission of an integrated circuit, based on the IC stripline method. Since several years, the development of ICs for in-vehicle networks is going from relatively low frequency controller area network (CAN) and local interconnect network (LIN) applications towards higher frequency ethernet applications. Due to higher frequencies and the strict requirements on EMC for automotive applications there is a need to predict the radiated emission performance of ICs on circuit and system level. For this reason, a simulation flow and methodology has been developed to be able to predict the radiated emission that originates from a single IC. The novel methodology has been validated with simple test structures and with measurements in an IC stripline of an ethernet switch application IC. |
Databáze: | OpenAIRE |
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