Characterization and optical properties of thin films formed on TiN coatings during electrochemical treatments
| Autor: | J.C. Francois, Jean Grimblot, Léon Gengembre, Y. Massiani, P. Gravier |
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| Rok vydání: | 1993 |
| Předmět: |
Metals and Alloys
Analytical chemistry Oxide chemistry.chemical_element Surfaces and Interfaces engineering.material Electrochemistry Surfaces Coatings and Films Electronic Optical and Magnetic Materials Dielectric spectroscopy chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Coating Materials Chemistry engineering Thin film Polarization (electrochemistry) Tin |
| Zdroj: | Thin Solid Films. 223:223-229 |
| ISSN: | 0040-6090 |
| DOI: | 10.1016/0040-6090(93)90525-t |
| Popis: | During electrochemical investigation of TiN coatings, in an H2SO4 solution, we observed that the samples maintained under a 1200 mV (SSE) polarization for 1 h which were initially golden yellow became roseate, the reasons for this modification probably being the formation of a thicker oxidized layer. The presence of this oxidized layer has previously been pointed out by electrochemical impedance spectroscopy. Optical studies show that beyond the anodic peak, i.e. for samples polarized at 900 and 1200 mV (SSE), an oxide layer was present. The XPS study confirms this hypothesis showing the drastic evolution in the O/Ti and N/Ti superficial ratios beyond the anodic peak. This study clearly shows the possibility of obtaining an oxidized layer on TiN coating by means of an electrochemical process. The optical properties of the TiO2/TiN stack, noticeably the fact that we can obtain a zero reflectivity at 2.55 eV, can lead to interesting practical applications. |
| Databáze: | OpenAIRE |
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