Autor: |
R. L. Henry, J. D. Oberstar, E.M. Swiggard, Peter Williams, Judith E. Baker, B. G. Streetman |
Rok vydání: |
1981 |
Předmět: |
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Zdroj: |
Journal of Crystal Growth. 54:443-448 |
ISSN: |
0022-0248 |
DOI: |
10.1016/0022-0248(81)90497-8 |
Popis: |
We have examined polycrystalline and single crystal, liquid encapsulated Czochralski (LEC) grown InP for evidence of boron contamination using secondary-ion mass spectrometry (SIMS) and photoluminescence. Precipitates of boron or a boron compound have been found in InP grown by the LEC method with boric oxide (B 2 O 3 ) encapsulation and pyrolytic boron nitride (pBN) crucibles. The density of precipatates appears to increase towards the last-to-freeze end of the boules. Neither B 2 O 3 or pBN appears to be solely responsible for the observed phenomenon. At present, the source of boron contamination most consistent with our observations is the result of interaction between B 2 O 3 and pBN. A diffusion coefficient of D (750°C) -14 cm 2 s -1 for boron in InP has been determined in this work. |
Databáze: |
OpenAIRE |
Externí odkaz: |
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