Emissivity measurements of 3D photonic crystals at high temperatures
| Autor: | Ihab El-Kady, Jason C. Verley, G. Subramania, Tim McLellan, T.S. Luk |
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| Rok vydání: | 2008 |
| Předmět: |
Materials science
business.industry Astrophysics::High Energy Astrophysical Phenomena Direct method Measure (physics) Physics::Optics Astrophysics::Cosmology and Extragalactic Astrophysics Substrate (electronics) Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Optics Hardware and Architecture Thermal radiation Emissivity Electrical and Electronic Engineering Photonics business Astrophysics::Galaxy Astrophysics Photonic crystal Common emitter |
| Zdroj: | Photonics and Nanostructures - Fundamentals and Applications. 6:81-86 |
| ISSN: | 1569-4410 |
| DOI: | 10.1016/j.photonics.2007.10.002 |
| Popis: | An accurate methodology is presented to measure photonic crystal emissivity using a direct method. This method addresses the issue of how to separate the emissions from the photonic crystal and the substrate. The method requires measuring two quantities: the total emissivity of the photonic crystal–substrate system, and the emissivity of the substrate alone. Our measurements have an uncertainty of 4% and represent the most accurate measure of a photonic crystal's emissivity. The measured results are compared to, and agree very well with, the independent emitter model. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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