Reliability investigations of 1.55 μm bulk semiconductor optical amplifier using functional parameter measurements

Autor:	S. Squedin, Y. Danto, X. Boddaert, C. Porcheron, A. Denolle, L. Bechou, A. Crottini, Monique Renaud, D. Laffitte, A. Coquelin, S. Huyghe, D. Keller, C. Ollivier, P. Volto
Rok vydání:	2003
Předmět:	Optical amplifier chemistry.chemical_compound Materials science Reliability (semiconductor) chemistry business.industry Optoelectronics business Gallium arsenide
Zdroj:	International Conference onIndium Phosphide and Related Materials, 2003..
DOI:	10.1109/iciprm.2003.1205341
Popis:	We report results of ageing tests (270 mA, 100/spl deg/C) applied to 1.55 /spl mu/m Semiconductor Optical Amplifier (SOA) of 500 /spl mu/m length active region for reliability investigations and show the strong relationship between functional parameters and their drifts versus ageing time.
Databáze:	OpenAIRE
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