Fluorescent emission characteristics of polycrystalline diamond film prepared by direct current jet CVD
| Autor: | Lan Li, Lan-fang Wang, Zhong-peng Zhang, Jin-yan Zhuang, Xi-ming Chen |
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| Rok vydání: | 2009 |
| Předmět: |
Materials science
Material properties of diamond Analytical chemistry Diamond Cathodoluminescence Chemical vapor deposition engineering.material Condensed Matter Physics Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials symbols.namesake Carbon film Vacancy defect symbols engineering Crystallite Electrical and Electronic Engineering Raman spectroscopy |
| Zdroj: | Optoelectronics Letters. 5:356-358 |
| ISSN: | 1993-5013 1673-1905 |
| DOI: | 10.1007/s11801-009-9160-1 |
| Popis: | The free-standing diamond films are deposited on molybdenum substrate by direct current jet chemical vapor deposition (DCJCVD). X-ray diffraction, Raman spectroscopy and cathodoluminescence (CL) measurement are used to investigate the films structure and defects related to electron transition properties of the diamond films. The X-ray diffraction spectrum reveals that the diamond films have the polycrystalline cubic structure with diffraction peaks at 43.88° and 75.24°. A sharp peak at 1331.8 cm−1 and a broad band at about 1250–1550 cm−1 from Raman spectrum are attributed to diamond phase and sp2-type carbons, respectively. Two emission peaks at 440 nm and 530 nm, associated with dislocation defects and nitrogen and vacancy complexes respectively, are observed in cathodoluminescence spectrum. In addition, in order to understand both emission processes, a simple energy level scheme is suggested. |
| Databáze: | OpenAIRE |
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