Hot-spot detection and correction using full-chip based process window analysis

Autor:	Sang-Wook Kim, Sung-Soo Suh, Young-Chang Kim, Suk-Joo Lee, Jung-Hyeon Lee, Chang-Jin Kang, Joo-Tae Moon
Rok vydání:	2007
Předmět:	Optics Materials science business.industry Hot spot (veterinary medicine) Process window business Chip
Zdroj:	2007 Digest of papers Microprocesses and Nanotechnology.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::32ff8466928a04ba780842643c55a099 https://doi.org/10.1109/imnc.2007.4456102 Zobrazit plný text záznamu