A non-destructive analysis of the influence of sputter-etching on the magnetic surface properties of manganese zinc ferrite (100) surfaces using ellipsometry and the polar magneto-optical Kerr effect

Autor:	H.M. van Noort, M. Erman, J.W.D. Martens
Rok vydání:	1984
Předmět:	Materials science Kerr effect business.industry Analytical chemistry Condensed Matter Physics Electronic Optical and Magnetic Materials Optics Magneto-optic Kerr effect Sputtering Ellipsometry Conversion electron mössbauer spectroscopy Surface layer Spectroscopy business Single crystal
Zdroj:	Journal of Magnetism and Magnetic Materials. 42:279-285
ISSN:	0304-8853
DOI:	10.1016/0304-8853(84)90109-4
Popis:	Ellipsometry and the polar magneto-optical Kerr effect have been used in the photon energy range 0.65 eV⩽hv⩽5.4 eV to study sputter-etched manganese zinc ferrite (100) surfaces. With an annealed sample as a reference, a stratified media calculation indicates the presence of a paramagnetic surface layer of 8–40 nm thickness, depending on sputter parameters. Conversion electron Mossbauer spectroscopy and Rutherford backscattering spectroscopy fully confirmed these results.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::32b3d88b819bb835c34592c0754fd4ec https://doi.org/10.1016/0304-8853(84)90109-4 Zobrazit plný text záznamu