Scanning Electron Microscopy Cathodoluminescence Studies of Piezoelectric Fields in an InGaN Multiple Quantum Well Light-Emitting Diode

Autor:	Phillip E. Russell, K. L. Bunker, Roberto Garcia
Rok vydání:	2005
Předmět:	Materials science Field (physics) Scanning electron microscope business.industry Scanning confocal electron microscopy Cathodoluminescence Electroluminescence Piezoelectricity Blueshift law.invention Optics law Optoelectronics business Instrumentation Light-emitting diode
Zdroj:	Microscopy and Microanalysis. 11
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927605507815
Popis:	Scanning Electron Microscopy (SEM)-based Cathodoluminescence (CL) experiments were used to study the influence of piezoelectric fields on the optical and electrical properties of a commercial InGaN-based Multiple Quantum Well (MQW) Light Emitting Diode (LED). The existence and direction of a piezoelectric field in the InGaN-based LED was determined with voltage dependent SEM-CL experiments. The CL emission peak showed a blueshift followed by a redshift with increasing reverse bias due to the full compensation of the piezoelectric field. It was determined that the piezoelectric field points in the [000-1] direction and the magnitude was estimated to be approximately 1.0±0.2 MV/cm. SEM-CL carrier generation density variation and electroluminescence experiments were used to confirm the existence of a piezoelectric field in the InGaN-based MQW LED.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::32ae0a967362f343943f2a29cbfda17a https://doi.org/10.1017/s1431927605507815 Zobrazit plný text záznamu