In situtransmission electron microscopy study of plastic deformation in passivated Al–Cu thin films

Autor:	I. S. Yeo, D. Jawarani, Hisao Kawasaki, J. P. Stark, Llewellyn K Rabenberg, Paul S. Ho
Rok vydání:	1997
Předmět:	In situ transmission electron microscopy Materials science Transmission electron microscopy Metallurgy General Physics and Astronomy Slip (materials science) Metallic thin films Thin film Composite material Grain size Grain orientation
Zdroj:	Journal of Applied Physics. 82:171-181
ISSN:	1089-7550 0021-8979
Popis:	Plastic deformation in passivated Al-1 wt %Cu thin films was studied in situ using a straining device in the transmission electron microscope. Both edge and screw dislocations were found to have caused slip on inclined {111} planes. Multiple slip was frequently observed as two or more sets of intersecting slip traces. Microstructural investigations of both unpassivated and passivated Al-1 wt %Cu films indicate that grain size and encapsulation by passivating layers are major contributors to strength of a thin film with a particular thickness. Additional strengthening is also provided by interactions between dislocations on multiple slip systems. The roles of grain orientation and precipitates in plastic deformation are also discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::32a6868510d79ff8f1017fee340311f1 https://doi.org/10.1063/1.365584 Zobrazit plný text záznamu