Infrared and Raman Studies of Si-Chalcogenide Glasses
| Autor: | R. K. Grasselli, Richard S. Henderson, M. Tenhover, D. B. Lukco, M. A. Hazle |
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| Rok vydání: | 1987 |
| Předmět: |
Range (particle radiation)
Materials science Infrared Chalcogenide Chalcogenide glass Radial distribution function Condensed Matter::Disordered Systems and Neural Networks Crystallography symbols.namesake chemistry.chemical_compound chemistry Molecular vibration symbols Tetrahedron Raman spectroscopy |
| Zdroj: | Design of New Materials ISBN: 9781461595038 |
| DOI: | 10.1007/978-1-4615-9501-4_16 |
| Popis: | The atomic structure of Si xX1-x (X=S,Se) glasses is investigated with the combined use of Infrared and high resolution Raman spectroscopy. These measurements permit a careful analysis of the various vibrational modes and the evaluation of structural models for the glasses. Glassy SiX2 alloys are composed of both chains of edge-sharing tetrahedral units and corner-sharing units in which the Si atoms are four-fold coordinated to X atoms and the X atoms are two-fold coordinated to Si atoms. These edge-sharing and corner-sharing tetrahedral units are also present throughout the glass forming range. In the entire composition range studied (0.05 l/3) and is identified as ethane-like X3-Si-Si-X3 units. The combined use of infrared and Raman spectroscopies provides the strongest evidence to date for the presence of extensive short and medium range order in the Si-chalcogenide glasses. |
| Databáze: | OpenAIRE |
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