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Publisher Summary This chapter explains various techniques for testing data converters. It further discusses about static DAC testing or static digital-to-analog converter testing. It tells that the static absolute accuracy of DAC can be described in terms of three fundamental kinds of errors—offset errors, gain errors, and integral nonlinearity errors—of which linearity errors are the most important. The chapter elaborates that there are many methods to measure the static errors of a DAC. The chapter also explains about the most commonly specified endpoint errors related with DACs, which are offset error, gain error, and bipolar zero error. It also details about integral nonlinearity (INL) and differential nonlinearity (DNL), and relation between superposition and DAC errors. It also details about measuring DAC DNL and INL using superposition, and measuring DAC INL and DNL where superposition does not hold. The chapter further explains about settling time, glitch impulse area, oscilloscope measurement of settling time and glitch impulse area, and distortion measurements with reference to testing DACs for dynamic performance. |
