Investigation of Electron Beam Deposition Parameters Within a Scanning Electron Microscope

Autor:	Vinayak P. Dravid, Benjamin D. Myers, Karl A. Hujsak, William Kellogg
Rok vydání:	2018
Předmět:	Materials science Scanning electron microscope business.industry Electron beam deposition Optoelectronics 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 0210 nano-technology business 01 natural sciences Instrumentation 0104 chemical sciences
Zdroj:	Microscopy and Microanalysis. 24:278-279
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927618001885
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3262b4d03a9aedde0254cfc7d4f16413 https://doi.org/10.1017/s1431927618001885 Zobrazit plný text záznamu