The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence

Autor:	Rainer Waser, M. Grossmann, U. Boettger, T. Schneller, D. Bolten, O. Lohse
Rok vydání:	2002
Předmět:	Work (thermodynamics) Materials science Condensed matter physics Dopant Electric field General Physics and Astronomy Nanotechnology Surface layer Dielectric Thin film Polarization (electrochemistry) Ferroelectricity
Zdroj:	Journal of Applied Physics. 92:2680-2687
ISSN:	1089-7550 0021-8979
Popis:	Comprehensive imprint measurements on PbZrxTi1−xO3 (PZT) thin films were carried out. Different models, which were proposed in literature to explain imprint in ferroelectric thin films or a similar aging effect (internal bias) in ferroelectric bulk material, are reviewed. Discrepancies between the experimental results obtained on the PZT films in this work and the prediction of the literature models indicate that these models do not describe the dominant imprint mechanism in PZT thin films. Hence, in this work a model is proposed which suggests imprint to be caused by a strong electric field within a thin surface layer in which the ferroelectric polarization is smaller or even absent compared to the bulk of the film. With the proposed imprint model the influence of important experimental parameters like dopant, illumination, and bias dependence can be qualitatively explained.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::32212c4a687a103f75c79e5cf5ed18ab https://doi.org/10.1063/1.1498966 Zobrazit plný text záznamu