Thin film phase transformation kinetics: From theory to experiment
| Autor: | M.M. Moghadam, Peter W. Voorhees |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Yield (engineering) Materials science Mechanical Engineering Metals and Alloys Nucleation Thermodynamics 02 engineering and technology Activation energy 021001 nanoscience & nanotechnology Condensed Matter Physics Kinetic energy 01 natural sciences Transformation (function) Reaction rate constant Mechanics of Materials Phase (matter) 0103 physical sciences General Materials Science Thin film 0210 nano-technology |
| Zdroj: | Scripta Materialia. 124:164-168 |
| ISSN: | 1359-6462 |
| DOI: | 10.1016/j.scriptamat.2016.07.010 |
| Popis: | The Level-set method simulation is used to address the effect of finite size on kinetics of thin film phase transformations. The results are first interpreted using the classic Johnson-Mehl-Avrami-Kolmogorov (JMAK) description of a nucleation and growth phase transformation that yields the average Avrami exponent and rate constant as a function of film thickness. The analysis reveals that the JMAK framework can yield a spurious thickness dependent activation energy for the transformation. To overcome this problem, we propose an analysis that allows all the kinetic parameters, including the nucleation rate and interface growth velocity in films to be determined from experiment. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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