X-ray study of the oxidation of liquid-gallium surfaces

Autor:	Elaine DiMasi, M. J. Regan, Benjamin M. Ocko, Peter S. Pershan, Moshe Deutsch, Olaf M. Magnussen, H. Tostmann
Rok vydání:	1997
Předmět:	Capillary wave chemistry.chemical_compound Materials science chemistry Excited state Oxide Analytical chemistry chemistry.chemical_element Surface finish Crystal structure Gallium Oxygen Amorphous solid
Zdroj:	Physical Review B. 55:10786-10790
ISSN:	1095-3795 0163-1829
DOI:	10.1103/physrevb.55.10786
Popis:	and roughness of the liquid/oxide and oxide/vapor interfaces do not change with oxygen dosage up to 1600 L nor with temperature up to 573 K. This is in contrast to what is observed for the bare liquid-Ga surface, which is roughened significantly by thermally excited capillary waves with temperatures up to only 443 K. This is a good indication that the oxide layer provides rigidity to the liquid surface and is likely a solid; grazingincidence measurements suggest that the film is amorphous or poorly crystallized. Based on comparisons with known crystal structures, models are suggested for the atomic arrangements in the gallium oxide layer and its interface with the underlying liquid. @S0163-1829~97!03815-0#
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::31f8976edf4a4809a027ebd1c87228c1 https://doi.org/10.1103/physrevb.55.10786 Zobrazit plný text záznamu