Fault detection in configurable switched-capacitor filters using transient analysis and dynamic time warping
| Autor: | Emanuel Dri, Gabriela Peretti, Eduardo Romero |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
Dynamic time warping
Computer science 020208 electrical & electronic engineering 020206 networking & telecommunications Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology Fault injection Similarity measure Switched capacitor Fault (power engineering) Transient analysis Fault detection and isolation Surfaces Coatings and Films law.invention Capacitor Hardware and Architecture law Signal Processing 0202 electrical engineering electronic engineering information engineering Electronic engineering |
| Zdroj: | Analog Integrated Circuits and Signal Processing. 108:291-304 |
| ISSN: | 1573-1979 0925-1030 |
| DOI: | 10.1007/s10470-021-01888-x |
| Popis: | In this work, we address a low-cost test of switched capacitors filters embedded in configurable analog sections. The proposal improves the Transient Analysis Method (TRAM) by incorporating a similarity measure, dynamic time warping. In this way, we extend TRAM to cases that that initially were not compatible and simplify the test of filters of order higher than two. This paper performs the test evaluation by developing a new simulation model of the addressed system that supports fault injection and simulation. A comparison with experimental data in both normal and faulty behavior validates the model. We consider catastrophic faults in the switches (stuck at open and short) and capacitors (shorts and opens), and deviation faults in the capacitors. The fault simulation results validate the test proposed here. |
| Databáze: | OpenAIRE |
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