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Due to their exceptional properties, lead zirconate titanate (PZT) ceramics are used in electronic and microelectronic applications. However, the physical properties of ceramic PZTs must be optimized. Extensive studies to develop donor or acceptor dopants have shown that properties can be tuned by doping of PZT ceramics. In this context, we synthesized ceramic samples of Pb(Zr1-xTix)O3 (PZT) (x = 0.0, 0.5, 1.0, 3.0) by a polymeric precursor process. Our aim was to investigate how the erbium (Er) concentration affects the PZT electrical properties. To characterize the samples, X-ray diffraction, scanning electronic microscopy, dielectric, and piezoelectric investigations were carried out. The X-ray diffraction analysis of the materials at room temperature confirmed their formation in single-phase with tetragonal crystal structure. Furthermore, scanning electronic microscopy analysis revealed that the microstructures had particles with mean size about 0.54–2.01 μm. The dielectric and piezoelectric properties of PZT–Er ceramics were investigated from room temperature to 550 °C at 106 Hz. Results showed that the ceramics experienced a diffuse phase transition. For phase transition of these compounds, we found diffusivity values of 1.60–1.80, indicating the variation of degree of disorder in the system. The value of remanent polarization and coercive field slightly decreased as a function of increase in Er3+. |
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