Single-Event Upset Cross-Section Trends for D-FFs at the 5- and 7-nm Bulk FinFET Technology Nodes

Autor:	Yoni Xiong, Nicholas J. Pieper, Alexandra T. Feeley, Balaji Narasimham, Dennis R. Ball, Bharat L. Bhuva
Rok vydání:	2023
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 70:381-386
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2022.3226210
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::31aa30adc0859d05f7903efce4b97918 https://doi.org/10.1109/tns.2022.3226210 Zobrazit plný text záznamu