A comparison of ZAF-correction methods in quantitative X-ray microanalysis of light-element specimens

Autor:	A. Boekestein, A.L.H. Stols, G.M. Roomans, A.M. Stadhouders
Rok vydání:	1983
Předmět:	Correction method Chemistry Analytical chemistry Electron microprobe Instrumentation Microanalysis Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials X ray microanalysis
Zdroj:	Ultramicroscopy. 12:65-68
ISSN:	0304-3991
DOI:	10.1016/0304-3991(83)90306-6
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::317bddfcf21b9d7782fdc7d54be114c4 https://doi.org/10.1016/0304-3991(83)90306-6 Zobrazit plný text záznamu