Erase Modeling of Charge Trap Flash Cells and Its Application to Trap Energy Extraction of Dielectric Thin Films

Autor: Geon-Woong Kim, Seung-Jae Baik
Rok vydání: 2022
Zdroj: Journal of the Institute of Electronics and Information Engineers. 59:104-111
ISSN: 2287-5026
DOI: 10.5573/ieie.2022.59.1.104
Databáze: OpenAIRE