Erase Modeling of Charge Trap Flash Cells and Its Application to Trap Energy Extraction of Dielectric Thin Films
Autor: | Geon-Woong Kim, Seung-Jae Baik |
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Rok vydání: | 2022 |
Zdroj: | Journal of the Institute of Electronics and Information Engineers. 59:104-111 |
ISSN: | 2287-5026 |
DOI: | 10.5573/ieie.2022.59.1.104 |
Databáze: | OpenAIRE |
Externí odkaz: |