Superconducting ultrahigh-speed time domain reflectometry measurement system for electrical characterization of transmission line structures
Autor: | Katsuya Kikuchi, Hiroshi Sato, Masahiro Aoyagi, Hiroshi Nakagawa, Hiroshi Akoh |
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Rok vydání: | 2003 |
Předmět: |
Materials science
business.industry Metals and Alloys Integrated circuit Condensed Matter Physics Signal Microstrip law.invention Time-domain reflectometry law Transmission line Condensed Matter::Superconductivity Rise time Materials Chemistry Ceramics and Composites Optoelectronics Time domain Electrical and Electronic Engineering business Reflectometry |
Zdroj: | Superconductor Science and Technology. 16:1434-1437 |
ISSN: | 1361-6668 0953-2048 |
DOI: | 10.1088/0953-2048/16/12/025 |
Popis: | A superconducting Josephson sampling measurement system with excellent time resolution on the picosecond scale is a highly useful tool for analysing ultrahigh-speed electrical signals in a cryogenic environment. The Josephson sampling circuit was designed and fabricated with high-Jc Nb/AlOx/Nb junction integrated circuit technology. A time domain reflectometry (TDR) measurement system using a superconducting sampling circuit and a superconducting step signal generator has been developed. TDR measurement of superconducting microstrip lines was successfully carried out with a 6 ps rise time step signal. The electrical characterization of the microstrip lines was achieved. |
Databáze: | OpenAIRE |
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