An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application
| Autor: | Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue |
|---|---|
| Rok vydání: | 2022 |
| Zdroj: | 2022 IEEE International Test Conference in Asia (ITC-Asia). |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|