Frequency Scan Spectra of Surface Plasmons Excitation in an Arbitrary Multilayer System

Autor:	Chih-Hsiung Liao, Jiann-Shing Shyu
Rok vydání:	2001
Předmět:	Materials science business.industry Surface plasmon General Engineering Physics::Optics General Physics and Astronomy Dielectric Function (mathematics) Chemical sensor Spectral line Wavelength Optics Sensitivity (control systems) business Excitation
Zdroj:	Japanese Journal of Applied Physics. 40:4109
ISSN:	1347-4065 0021-4922
DOI:	10.1143/jjap.40.4109
Popis:	In this paper, we have derived approximate formulas from the Fresnel formulas and pole expansion for the reflectivity and resonant frequency in an arbitrary multilayer system. In accordance with the results of simulation, we conclude that the resonant wavelength increases when the incidence angle decreases and the resonant frequency increases when the metal thickness increases. Moreover the sensitivity of the resonant frequency versus the metal thickness is very large when the metal thickness is modulated from 10 nm to 60 nm. One can make use of these properties to fabricate the instrument of the metal film measurement. Besides, the resonant frequency is a function of the environment dielectric constant. One can apply the property to the chemical sensor based on surface plasmons (SPs) measurement.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::304135c2732908f1cd8f41370028e60c https://doi.org/10.1143/jjap.40.4109 Zobrazit plný text záznamu