Study on the Correlation Analysis between Leakage-Current Generation and Temperature using Half Circuit

Autor:	Eunseok Park, Se-Hong Min
Rok vydání:	2019
Předmět:	business.industry Computer science Correlation analysis Optoelectronics business
Zdroj:	Journal of the Korean Society of Hazard Mitigation. 19:241-245
ISSN:	2287-6723 1738-2424
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::3024fc77f094c2ae5f433ba78c1e166c https://doi.org/10.9798/kosham.2019.19.7.241 Zobrazit plný text záznamu