Measurement of the Distribution Profile of Electroluminescence Cutoff Frequencies over the Area of a Light-Emitting Heterostructure

Autor:	V. A. Sergeev, O. A. Radaev, I. V. Frolov
Rok vydání:	2021
Předmět:	010302 applied physics CMOS sensor Brightness Materials science 010308 nuclear & particles physics business.industry Homogeneity (statistics) Electroluminescence 01 natural sciences Cutoff frequency Optics 0103 physical sciences Astrophysics::Solar and Stellar Astrophysics Cutoff business Instrumentation Image resolution Diode
Zdroj:	Instruments and Experimental Techniques. 64:259-263
ISSN:	1608-3180 0020-4412
DOI:	10.1134/s0020441221010231
Popis:	A hardware–software complex that has no analogues in Russia and abroad and that is designed to measure the distribution of the cutoff frequency of electroluminescence over the area of a light-emitting heterostructure (LHS) is described. The complex provides a spatial resolution of 0.65 µm, an upper measurement limit of 40 MHz, and a relative error of 2%. The electroluminescence cutoff frequency in local areas of an LHS is determined from the decay of the brightness of pixels of LHS images by 1.19 times obtained using a digital CMOS camera with a step-by-step increase in the pulse repetition rate of the LHS-supplying current with an off-duty factor of 2. The complex and the measurement method were tested on commercial green light-emitting diodes. The results of measuring the cutoff-frequency distribution can be used to assess the homogeneity of LHSs.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::30180a6d9ab0e6b0228eb8ceaa87634b https://doi.org/10.1134/s0020441221010231 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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