Real-space pseudopotential calculations for simulating noncontact atomic force microscopy images

Autor: Dingxin Fan, James R. Chelikowsky, Yuki Sakai
Rok vydání: 2018
Předmět:
Zdroj: Journal of Vacuum Science & Technology B. 36:04H102
ISSN: 2166-2754
2166-2746
Popis: Noncontact atomic force microscopy (nc-AFM) with a CO-functionalized tip yields high resolution images under many situations. However, nc-AFM images are sometimes difficult to interpret when visualizing polycyclic aromatic hydrocarbons. The authors employ real-space pseudopotentials constructed using density functional theory to simulate nc-AFM images of benzene and dibenzo(cd,n)naphtho(3,2,1,8-pqra)perylene molecules with selected probe tips (such as CO, H2, N2, Br, and CH2O). The selected tips provide accurate simulations, save for the tip functionalized with a Br atom. The authors find contrast inversion with CO and N2 tips at small tip heights and image distortion with the CH2O tip.Noncontact atomic force microscopy (nc-AFM) with a CO-functionalized tip yields high resolution images under many situations. However, nc-AFM images are sometimes difficult to interpret when visualizing polycyclic aromatic hydrocarbons. The authors employ real-space pseudopotentials constructed using density functional theory to simulate nc-AFM images of benzene and dibenzo(cd,n)naphtho(3,2,1,8-pqra)perylene molecules with selected probe tips (such as CO, H2, N2, Br, and CH2O). The selected tips provide accurate simulations, save for the tip functionalized with a Br atom. The authors find contrast inversion with CO and N2 tips at small tip heights and image distortion with the CH2O tip.
Databáze: OpenAIRE