X-ray microscopy in the carbon window region
| Autor: | I. A. Artyukov, S. V. Savel’ev, Yu. S. Kas'yanov, Aleksandr V Vinogradov |
|---|---|
| Rok vydání: | 2004 |
| Předmět: |
Physics
business.industry X-ray chemistry.chemical_element Window (computing) Statistical and Nonlinear Physics Lambda Atomic and Molecular Physics and Optics Image contrast Electronic Optical and Magnetic Materials Wavelength Optics chemistry Microscopy Electrical and Electronic Engineering business Penetration depth Carbon |
| Zdroj: | Quantum Electronics. 34:691-692 |
| ISSN: | 1468-4799 1063-7818 |
| DOI: | 10.1070/qe2004v034n08abeh002723 |
| Popis: | It is proposed to use X-rays with wavelengths in the carbon window region (4.4nm < {lambda} < 5nm) in order to enhance the image contrast in studies of biological objects. (letters) |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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