A Novel Physical Unclonable Function: NBTI-PUF Realized by Random Trap Fluctuation (RTF) Enhanced True Randomness in 14 nm FinFET Platform
| Autor: | L. C. Lin, E R. Hsieh, T. C. Kao, M. Y. Lee, J. K. Chang, J. C. Guo, S. S. Chung, T. P. Chen, S. A. Huang, T. J. Chen, O. Cheng |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA). |
| DOI: | 10.1109/vlsi-tsa54299.2022.9770980 |
| Databáze: | OpenAIRE |
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