FIB/TEM Investigation of crystallographic defects in type-II superlattice based infrared detectors

Autor:	Jill D. Nolde, Eric M. Jackson, Nabil Bassim, A. Aifer, Jerry R. Meyer, Igor Vurgaftman, S. I. Maximenko, Chadwick L. Canedy, Chaffra A. Affouda
Rok vydání:	2012
Předmět:	Materials science Optics Infrared business.industry Superlattice Detector business Instrumentation
Zdroj:	Microscopy and Microanalysis. 18:1806-1807
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927612010884
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2fbb76915ad076423d6fcd6ba71987e4 https://doi.org/10.1017/s1431927612010884 Zobrazit plný text záznamu