Insight Into the Leakage Current Transport Mechanism Transformation in β-Ga2O3 SBDs Under Forward Bias Stress

Autor:	Ailing Pan, Yingzhe Wang, Xuefeng Zheng, Yuehua Hong, Fang Zhang, Xiangyu Zhang, Ling Lv, Yanrong Cao, Xiaohua Ma, Yue Hao
Rok vydání:	2023
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Electron Devices. 70:3185-3190
ISSN:	1557-9646 0018-9383
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2f964b3d7c5a1938835b41d30c9b0cf7 https://doi.org/10.1109/ted.2023.3267756 Zobrazit plný text záznamu