Simulating Nuclear Events in a TCAD Model of a High-Density SEU Hardened SRAM Technology

Autor:	D.R. Ball, R.D. Schrimpf, N.F. Haddad, K.M. Warren, R.A. Weller, R.A. Reed, A. Kobayashi, J.A. Pellish, M.H. Mendenhall, C.L. Howe, L.W. Massengill
Rok vydání:	2005
Předmět:	Nuclear reaction Materials science Nuclear engineering Static random-access memory
Zdroj:	2005 8th European Conference on Radiation and Its Effects on Components and Systems.
DOI:	10.1109/radecs.2005.4365566
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2f8d930e9e357e949e65be8e9e90b1f7 https://doi.org/10.1109/radecs.2005.4365566 Zobrazit plný text záznamu