Special Topics in Metrology

Autor:	Eric Forrest, Nevin Martin, Collin J. Delker, Stephen V. Crowder
Rok vydání:	2020
Předmět:	Sample size determination Computer science System of measurement Bayesian probability Measurement uncertainty Data mining Statistical process control computer.software_genre computer Metrology
Zdroj:	Introduction to Statistics in Metrology ISBN: 9783030533281
Popis:	Metrology guides such as the JCGM 100 and JCGM 101 present in detail the most commonly used methods for evaluating measurement uncertainty. Additional guides for less commonly used methods are in development. In this chapter we present an overview of methods that we find valuable and deserving of more coverage. These methods include statistical process control (SPC), binary measurement systems (BMS), destructive measurements, sample size determination, and Bayesian analysis in metrology.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2f3da9179c0ed81f582e17344169dbba https://doi.org/10.1007/978-3-030-53329-8_11 Zobrazit plný text záznamu