Electron interference experiment with optically zero propagation distance for V-shaped double slit
| Autor: | Tetsuya Akashi, Yoshimasa A. Ono, Tetsuji Kodama, Shigeo Mori, Ken Harada, Yoshio Takahashi, Keiko Shimada |
|---|---|
| Rok vydání: | 2021 |
| Předmět: |
010302 applied physics
Physics business.industry Plane (geometry) Detector General Engineering General Physics and Astronomy 02 engineering and technology Electron Image plane 021001 nanoscience & nanotechnology Interference (wave propagation) 01 natural sciences law.invention Optics Position (vector) Transmission electron microscopy law 0103 physical sciences Electron microscope 0210 nano-technology business |
| Zdroj: | Applied Physics Express. 14:022006 |
| ISSN: | 1882-0786 1882-0778 |
| Popis: | In an electron double-slit experiment, an optically zero propagation distance condition (infocus imaging condition), in which the double-slit position was imaged just on the detector plane (image plane), was realized in a 1.2 MV field-emission transmission electron microscope. Interference fringes composed of dot images were controlled by using two electron biprisms. Using a V-shaped double slit, we observed the interference features under the pre-interference condition, interference condition and post-interference condition of electron waves. We conclude that it is possible to observe the interference fringes only when the path information of the individual electrons is not available. |
| Databáze: | OpenAIRE |
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