Post-silicon power mapping techniques for integrated circuits
| Autor: | Sherief Reda, Abdullah Nazma Nowroz, Ryan Cochran, Stefan Angelevski |
|---|---|
| Rok vydání: | 2013 |
| Předmět: |
Engineering
Silicon business.industry chemistry.chemical_element Inversion (meteorology) Hardware_PERFORMANCEANDRELIABILITY Integrated circuit Post-silicon validation law.invention Tikhonov regularization Power analysis chemistry Hardware and Architecture law Thermal Hardware_INTEGRATEDCIRCUITS Electronic engineering Quadratic programming Electrical and Electronic Engineering business Software |
| Zdroj: | Integration. 46:69-79 |
| ISSN: | 0167-9260 |
| DOI: | 10.1016/j.vlsi.2011.12.001 |
| Popis: | We propose a new methodology for post-silicon power validation using the captured thermal infrared emissions from the back-side of operational integrated circuits. We first identify the challenges associated with thermal to power inversion, and then we address these challenges by devising a quadratic optimization formulation that incorporates Tikhonov filtering techniques to find the most accurate power maps. To validate our methodology, a programmable circuit of micro-heaters is implemented to create a number of reference power maps. The thermal emissions from the circuit are captured using an infrared camera and then inverted to yield highly accurate post-silicon power maps. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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