| Autor: |
Mohamed Biskri, Jean Philippe Chateau-Cornu, Pierre Bastie, Alain Jacques, Thomas Schenk |
| Rok vydání: |
2014 |
| Předmět: |
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| Zdroj: |
Materials Science Forum. :2075-2080 |
| ISSN: |
1662-9752 |
| Popis: |
We present a computer inexpensive method to calculate the profile of the high resolution diffraction pattern of a single crystal superalloy. The displacement field is taken as the sum of the individual fields of cuboidal inclusions with uniform eigenstrains. Early simulations are compared to experimental data. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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