Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise

Autor:	M J Kirton, M J Uren
Rok vydání:	1989
Předmět:	Burst noise Materials science business.industry Interface (computing) Perspective (graphical) Optoelectronics Electronics Low frequency Condensed Matter Physics business Microstructure Signal Noise (electronics)
Zdroj:	Advances in Physics. 38:367-468
ISSN:	1460-6976 0001-8732
DOI:	10.1080/00018738900101122
Popis:	In very small electronic devices the alternate capture and emission of carriers at an individual defect site generates discrete switching in the device resistance—referred to as a random telegraph signal (RTS). The study of RTSs has provided a powerful means of investigating the capture and emission kinetics of single defects, has demonstrated the defect origins of low-frequency (1/ƒ) noise in these devices, and has provided new insight into the nature of defects at the Si/SiO2 interface.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2ebf9d1d5d904a60c2a53b3aff420784 https://doi.org/10.1080/00018738900101122 Zobrazit plný text záznamu